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Validity of Vegard’s rule for Al₁₋ₓ Inₓ N (0.08

Abstract:

In this work, comparative x-ray diffraction (XRD) and Rutherford backscattering spectrometry (RBS) measurements allow a comprehensive characterization of Al1-xInxN thin films grown on GaN. Within the limits of experimental accuracy, and in the compositional range 0.08 < x < 0.28, the lattice parameters of the alloys generally obey Vegard's rule, varying linearly with the InN fraction. Results are also consistent with the small deviation from linear behaviour suggested by Darakchieva et ...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1088/1361-6463/aa69dc

Authors


Magalhães, S More by this author
Watson, IM More by this author
Martin, RW More by this author
O’Donnell, KP More by this author
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Publisher:
Institute of Physics Publisher's website
Journal:
Journal of Physics D: Applied Physics Journal website
Volume:
50
Issue:
20
Pages:
205107
Publication date:
2017-04-05
Acceptance date:
2017-03-29
DOI:
EISSN:
1361-6463
ISSN:
0022-3727
Pubs id:
pubs:697226
URN:
uri:d274df2a-431f-4bcd-83e6-bd5354954b01
UUID:
uuid:d274df2a-431f-4bcd-83e6-bd5354954b01
Local pid:
pubs:697226

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