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Journal article : Review

Howard Flack and the Flack Parameter

Abstract:
The Flack Parameter is now almost universally reported for all chiral materials characterized by X-ray crystallography. Its elegant simplicity was an inspired development by Howard Flack, and although the original algorithm for its computation has been strengthened by other workers, it remains an essential outcome for any crystallographic structure determination. As with any one-parameter metric, it needs to be interpreted in the context of its standard uncertainty.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.3390/chemistry2040052

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Chemistry Research Laboratory
Role:
Author
ORCID:
0000-0001-9651-6308


Publisher:
MDPI
Journal:
Chemistry More from this journal
Volume:
2
Issue:
4
Pages:
796-804
Publication date:
2020-09-23
Acceptance date:
2020-09-21
DOI:
EISSN:
2624-8549


Language:
English
Keywords:
Subtype:
Review
Pubs id:
1133439
Local pid:
pubs:1133439
Deposit date:
2020-09-24
ARK identifier:

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