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LCAO ANALYSIS OF DISLOCATION-RELATED EPR-SPECTRA IN DEFORMED SILICON

Publication status:
Published

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Journal:
STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS 1989 More from this journal
Volume:
104
Pages:
187-192
Publication date:
1989-01-01
Event title:
6TH INTERNATIONAL SYMP ON THE STRUCTURE AND PROPERTIES OF DISLOCATIONS IN SEMICONDUCTORS
ISBN:
0854980601


Pubs id:
pubs:10047
UUID:
uuid:d1e279c3-146d-4366-b6b3-dddda5028d7c
Local pid:
pubs:10047
Source identifiers:
10047
Deposit date:
2012-12-19

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