Journal article
A slotline DC block for microwave, millimetre and sub-millimetre circuits
- Abstract:
- DC blocks are used frequently in planar circuits to enable separate DC voltage/current biasing of active components inserted along the transmission lines. In this Letter, we present a slotline DC block design where the conductors of the transmission line can be physically broken, while allowing the propagation of the RF signal across the discontinuity with negligible insertion loss. The DC block comprises two break-lines with narrow gaps, patterned on the two ground planes of a slotline with each breakline connected to an RF choke. The RF chokes present open circuit nodes that prevent the RF power from leaking into the break-lines gaps. We have fabricated and tested the DC block, and demonstrated that the measured performance agrees very well with simulated results. The insertion loss was close to – 0.5 dB in the designated range of 12–16 GHz, demonstrating that the RF leakage through the DC block is indeed negligible.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 1.8MB, Terms of use)
-
- Publisher copy:
- 10.1109/LMWC.2019.2931467
Authors
- Publisher:
- Institute of Electrical and Electronics Engineers
- Journal:
- IEEE Microwave and Wireless Components Letters More from this journal
- Volume:
- 29
- Issue:
- 9
- Pages:
- 583-585
- Publication date:
- 2019-08-06
- Acceptance date:
- 2019-07-24
- DOI:
- EISSN:
-
1558-1764
- ISSN:
-
1531-1309
- Keywords:
- Pubs id:
-
pubs:1034817
- UUID:
-
uuid:ce885061-14ec-4e7c-8b10-d582e48bfbcd
- Local pid:
-
pubs:1034817
- Source identifiers:
-
1034817
- Deposit date:
-
2019-07-24
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2019
- Notes:
- © 2019 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information. This is the accepted manuscript version of the article. The final version is available online from IEEE at: https://doi.org/10.1109/LMWC.2019.2931467
If you are the owner of this record, you can report an update to it here: Report update to this record