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Microscope imaging mass spectrometry with a reflectron

Abstract:

A time-of-flight microscope imaging mass spectrometer incorporating a reflectron was used to image mass-resolved ions generated from a 270 μm diameter surface. Mass and spatial resolutions of 8100 ± 700 m/Δm and 18 μm ± 6 μm, respectively, were obtained simultaneously by using pulsed extraction differential acceleration ion optical focusing to create a pseudo-source plane for a single-stage gridless reflectron. The obtainable mass resolution was limited only by the response time of the positi...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/1.5142271

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Name:
Engineering and Physical Sciences Research Council
Grant:
EP/L005913/1
Publisher:
AIP Publishing
Journal:
Review of Scientific Instruments More from this journal
Volume:
91
Issue:
2
Article number:
023306
Publication date:
2020-02-04
Acceptance date:
2020-01-13
DOI:
EISSN:
1089-7623
ISSN:
0034-6748
Language:
English
Keywords:
Pubs id:
1087356
Local pid:
pubs:1087356
Deposit date:
2020-02-18

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