Journal article
Investigation of C60F36 as low-volatility p-dopant in organic optoelectronic devices
- Abstract:
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We demonstrate highly efficient small molecule organic light emitting diodes and organic solar cells based on the p-i-n-type structure using the fluorinated fullerene molecule C60F36 as p-dopant in the hole transport layer. We present synthesis, chemical analysis, and energy level investigation of the dopant as well as the conductivity of organic layers consisting of a matrix of N,N,N′,N′-tetrakis 4-methoxyphenyl-benzidine(MeO-TPD) or N,N′-[(Diphenyl-N,N′-bis)9,9,-dimethyl-fluoren-2-yl]-benzidine(BF-DPB) doped by the fullerene compound. State of the art organic p-i-n devices containing C60F36 show efficiencies comparable to devices with the commonly used p-dopant2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4-TCNQ). The advantages of the fullerene based dopant are the low volatility and high thermal stability, which is beneficial for device operation under elevated temperature. These properties make C60F36 highly attractive for the usage as p-dopant in a broad spectrum of organic p-i-n devices like organic light emitting diodes, solar cells, memories, or transistors. © 2011 American Institute of Physics.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Preview, Version of record, pdf, 2.0MB, Terms of use)
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- Publisher copy:
- 10.1063/1.3590142
Authors
- Publisher:
- American Institute of Physics
- Journal:
- Journal of Applied Physics More from this journal
- Volume:
- 109
- Issue:
- 10
- Article number:
- 103102
- Publication date:
- 2011-05-15
- DOI:
- ISSN:
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0021-8979
- Language:
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English
- Pubs id:
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pubs:405374
- UUID:
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uuid:ca442d67-7585-45c4-9b13-b17eab61a35d
- Local pid:
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pubs:405374
- Source identifiers:
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405374
- Deposit date:
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2013-09-26
Terms of use
- Copyright holder:
- American Institute of Physics
- Copyright date:
- 2011
- Notes:
- Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 109, 103102 (2011) and may be found at http://dx.doi.org/10.1063/1.3590142
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