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The brittle-ductile transition in silicon. II. interpretation

Abstract:

A dynamic crack tip shielding model has been developed to describe the brittle-ductile transition (BDT) of precracked crystals in constant strain-rate tests. Dislocations are emitted from a discrete number of sources at or near the crack tip. At the BDT the dislocations are anddollar; emitted and move sufficiently rapidly to shield the most vulnerable parts of the crack, furthest away from the sources, such that the local stress intensity factor remains below K$_{Ic}$ for values of the app...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1098/rspa.1989.0002

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
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Name:
Science and Engineering Research Council
Publisher:
Royal Society
Journal:
Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences More from this journal
Volume:
421
Issue:
1860
Pages:
25-53
Publication date:
1989-01-09
DOI:
EISSN:
1471-2946
ISSN:
1364-5021
Pubs id:
pubs:8555
UUID:
uuid:ca1c5829-9b6e-400c-8d05-5cde90b65e03
Local pid:
pubs:8555
Source identifiers:
8555
Deposit date:
2012-12-19

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