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The development of strain anisotropy during plastic deformation of an aluminium polycrystal

Abstract:

To measure internal strains in an Al MMC, time-of-flight (TOF) ncutron diffraction was used on the ENGIN instrument at ISIS, RAL, in Oxfordshire, and a monochromated X-ray beam was employed on the BM16 beamline at the ESRF in Grenoble. The development of intergranular stresses between groups of grains possessing certain crystallographic orientations was studied using diffraction of penetrating radiation. Due to aluminum's highly isotropic elastic modulus, the variation of measured strains in ...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Publisher:
Trans Tech Publ
Volume:
347-3
Pages:
492-497
Host title:
ECRS 5: PROCEEDINGS OF THE FIFTH EUROPEAN CONFERENCE ON RESIDUAL STRESSES
Publication date:
2000-01-01
ISSN:
0255-5476
Source identifiers:
62968
ISBN:
0878498559
Keywords:
Pubs id:
pubs:62968
UUID:
uuid:c7fe98dc-2847-4b31-8c71-72de8fc271fc
Local pid:
pubs:62968
Deposit date:
2012-12-19

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