Transmission electron microscopy of deformed Ti-6Al-4V micro-cantilevers

Journal article

Abstract:: Activation of different slip systems in Ti-6Al-4V has a significant effect on mechanical properties. Triangular cross-section micro-cantilevers have been machined using FIB from a Ti-6Al-4V product and deformed using a nanoindenter. Each cantilever contains several alpha lamellae separated by thin fillets of beta. Slip occurs as well defined slip bands, which cross the beta fillets. TEM specimens with various orientations with respect to the cantilever have been machined from deformed cantilevers using FIB and the slip processes characterised.

Journal:: Ti 2011 - Proceedings of the 12th World Conference on Titanium More from this journal
Volume:: 1
Pages:: 783-786
Publication date:: 2012-01-01

Language:: English
Keywords:: Focused ion beam

Microcantilever

Titanium alloy

Transmission electron microscopy
Pubs id:: pubs:425721
UUID:: uuid:c71fbe23-e814-4b39-a316-c4fd0c9b3d23
Local pid:: pubs:425721
Source identifiers:: 425721
Deposit date:: 2013-11-17

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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