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Journal article

Single-ion deconvolution of mass-peak overlaps for atom probe microscopy

Abstract:

Due to the intrinsic evaporation properties of the material studied, insufficient mass-resolving power and lack of knowledge of the kinetic energy of incident ions, peaks in the atom probe mass-to-charge spectrum can overlap and result in incorrect composition measurements. Contributions to these peak overlaps can be deconvoluted globally, by simply examining adjacent peaks combined with knowledge of natural isotopic abundances. However, this strategy does not account for the fact that the re...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1017/S1431927616012782

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More from this funder
Funding agency for:
Haley, D
Grant:
EP/L014742/1
More from this funder
Funding agency for:
London, A
Grant:
EP/I003274/1
EP/I012400/1
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
23
Issue:
2
Pages:
300-306
Publication date:
2017-03-16
Acceptance date:
2016-12-21
DOI:
ISSN:
1435-8115
Source identifiers:
666789
Keywords:
Pubs id:
pubs:666789
UUID:
uuid:c65d477d-9d2b-4f66-8a91-f3b2e96c85b1
Local pid:
pubs:666789
Deposit date:
2016-12-21

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