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Journal article

Single-ion deconvolution of mass-peak overlaps for atom probe microscopy

Abstract:

Due to the intrinsic evaporation properties of the material studied, insufficient mass-resolving power and lack of knowledge of the kinetic energy of incident ions, peaks in the atom probe mass-to-charge spectrum can overlap and result in incorrect composition measurements. Contributions to these peak overlaps can be deconvoluted globally, by simply examining adjacent peaks combined with knowledge of natural isotopic abundances. However, this strategy does not account for the fact that the re...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Accepted Manuscript

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Publisher copy:
10.1017/S1431927616012782

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Department:
Oxford, MPLS, Materials
More by this author
Department:
Oxford, MPLS, Materials
More by this author
Department:
Oxford, MPLS, Materials
Publisher:
Cambridge University Press Publisher's website
Journal:
Microscopy and Microanalysis Journal website
Volume:
23
Issue:
2
Pages:
300-306
Publication date:
2017-03-16
Acceptance date:
2016-12-21
DOI:
ISSN:
1435-8115
Pubs id:
pubs:666789
URN:
uri:c65d477d-9d2b-4f66-8a91-f3b2e96c85b1
UUID:
uuid:c65d477d-9d2b-4f66-8a91-f3b2e96c85b1
Local pid:
pubs:666789

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