Journal article
On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper
- Publication status:
- Published
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- Publisher copy:
- 10.1093/oxfordjournals.jmicro.a023684
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Authors
Bibliographic Details
- Journal:
- JOURNAL OF ELECTRON MICROSCOPY
- Volume:
- 48
- Issue:
- 4
- Pages:
- 323-332
- Publication date:
- 1999-01-01
- DOI:
- EISSN:
-
1477-9986
- ISSN:
-
0022-0744
- Source identifiers:
-
14826
Item Description
- Keywords:
- Pubs id:
-
pubs:14826
- UUID:
-
uuid:c64f86a7-fe25-4b62-9a9f-5f0ef5174987
- Local pid:
- pubs:14826
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1999
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