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On the application of the weak-beam technique to the determination of the sizes of small point-defect clusters in ion-irradiated copper

Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
JOURNAL OF ELECTRON MICROSCOPY
Volume:
48
Issue:
4
Pages:
323-332
Publication date:
1999-01-01
DOI:
EISSN:
1477-9986
ISSN:
0022-0744
Source identifiers:
14826
Keywords:
Pubs id:
pubs:14826
UUID:
uuid:c64f86a7-fe25-4b62-9a9f-5f0ef5174987
Local pid:
pubs:14826
Deposit date:
2012-12-19

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