Conference item
Temperature evolution of topological surface states in bismuth selenide thin films studied using terahertz spectroscopy
- Abstract:
- We have measured the terahertz (THz) conductance of a 23 quintuple layer thick film of bismuth selenide (Bi2Se3) and found signatures for topological surface states (TSSs) below 50 K. We provide evidence for a topological phase transition as a function of lattice temperature by optical means. In this work, we used THz time-domain spectroscopy (THz-TDS) to measure the optical conductance of Bi2Se3, revealing metallic behavior at temperatures below 50 K. We measure the THz conductance of Bi2Se3 as 10 e2/h at 4 K, indicative of a surface dominated response. Furthermore, the THz conductance spectra reveal characteristic features at ~1.9 THz attributed to the optical phonon mode, which is weakly visible at low temperatures but which becomes more prominent with increasing temperature. These results present a first look at the temperature-dependent behavior of TSSs in Bi2Se3 and the capability to selectively identify and address them using THz spectroscopy.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
-
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(Preview, Accepted manuscript, pdf, 891.0KB, Terms of use)
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- Publisher copy:
- 10.1117/12.2249587
Authors
+ Engineering and Physical Sciences Research Council
More from this funder
- Grant:
- EP/J017671/1 - Coherent Terahertz Systems (COTS
- Publisher:
- SPIE
- Host title:
- Proceedings of SPIE
- Journal:
- Proceedings of SPIE More from this journal
- Volume:
- 10103D
- Issue:
- Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications X
- Publication date:
- 2017-02-24
- Acceptance date:
- 2017-02-24
- Event location:
- San Francisco, California, United States
- DOI:
- EISSN:
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1996-756X
- ISSN:
-
0277-786X
- Keywords:
- Pubs id:
-
pubs:685661
- UUID:
-
uuid:c3fcb8ba-ff7d-4d86-97c5-ee51a2532399
- Local pid:
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pubs:685661
- Source identifiers:
-
685661
- Deposit date:
-
2017-03-15
Terms of use
- Copyright holder:
- SPIE
- Copyright date:
- 2017
- Notes:
- © (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). This is the accepted manuscript version of the article. The final version is available online from SPIE at: [10.1117/12.2249587].
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