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Characterization of a direct detection device imaging camera for transmission electron microscopy.

Abstract:
The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.

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Publisher copy:
10.1016/j.ultramic.2010.03.007

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Journal:
Ultramicroscopy More from this journal
Volume:
110
Issue:
7
Pages:
744-747
Publication date:
2010-06-01
DOI:
EISSN:
1879-2723
ISSN:
0304-3991


Language:
English
Keywords:
Pubs id:
pubs:299526
UUID:
uuid:c2e21fc3-98a0-4e40-8478-046f09eaa4a6
Local pid:
pubs:299526
Source identifiers:
299526
Deposit date:
2013-11-16

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