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Low-loss EELS of 2D boron nitride

Abstract:

Electron energy loss spectroscopy provides a probe of the dielectric function of a material which can be affected by the size and morphology of a sample. In this paper, the effect on the loss function when hexagonal boron nitride is reduced to a single layer is investigated. The previously predicted red-shift of the spectrum is seen in experiment and reproduced by modelling using density functional theory. The dielectric function shows that, for a single layer, the lack of screening causes th...

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Publication status:
Published

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Authors


Nicholls, RJ More by this author
Perkins, JM More by this author
Nicolosi, V More by this author
McComb, DW More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
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Journal:
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011)
Volume:
371
Pages:
012060-012060
Publication date:
2012
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
URN:
uuid:c26021ea-cc42-4046-8a29-d4b55e1c287b
Source identifiers:
351028
Local pid:
pubs:351028
Language:
English

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