Low-loss EELS of 2D boron nitride

Journal article

Electron energy loss spectroscopy provides a probe of the dielectric function of a material which can be affected by the size and morphology of a sample. In this paper, the effect on the loss function when hexagonal boron nitride is reduced to a single layer is investigated. The previously predicted red-shift of the spectrum is seen in experiment and reproduced by modelling using density functional theory. The dielectric function shows that, for a single layer, the lack of screening causes the real part of the dielectric function to tend to 1 so that the loss function resembles the imaginary part of the dielectric function.

Authors: Nicholls, R; Perkins, J; Nicolosi, V; McComb, D; Nellist, P

• Publication status: Published
• Journal: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2011 (EMAG 2011)
• Volume: 371
• Pages: 012060-012060
• Publication date: 2012-01-01
• DOI: 10.1088/1742-6596/371/1/012060
• EISSN: 1742-6596
• ISSN: 1742-6588
• Language: English