Journal article
Contrast transfer and noise considerations in focused-probe electron ptychography
- Abstract:
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Electron ptychography is a 4-D STEM phase-contrast imaging technique with applications to light-element and beam-sensitive materials. Although the electron dose (electrons incident per unit area on the sample) is the primary figure of merit for imaging beam-sensitive materials, it is also necessary to consider the contrast transfer properties of the imaging technique. Here, we explore the contrast transfer properties of electron ptychography. The contrast transfer of focused-probe, non-iterat...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Accepted manuscript, 3.3MB, Terms of use)
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- Publisher copy:
- 10.1016/j.ultramic.2020.113189
Authors
Funding
+ Engineering and Physical Sciences Research Council
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Grant:
EP/M010708/1
EP/K040375/1
EP/S001999/1
Bibliographic Details
- Publisher:
- Elsevier
- Journal:
- Ultramicroscopy More from this journal
- Volume:
- 221
- Article number:
- 113189
- Publication date:
- 2020-12-17
- Acceptance date:
- 2020-11-30
- DOI:
- EISSN:
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1879-2723
- ISSN:
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0304-3991
- Pmid:
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33360480
Item Description
- Language:
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English
- Keywords:
- Pubs id:
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1151572
- Local pid:
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pubs:1151572
- Deposit date:
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2021-06-11
Terms of use
- Copyright holder:
- Elsevier B.V.
- Copyright date:
- 2021
- Rights statement:
- © 2021 Elsevier B.V. All rights reserved.
- Notes:
-
This is the accepted manuscript version of the article. The final version is available from Elsevier at https://doi.org/10.1016/j.ultramic.2020.113189
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