Journal article
Device-independent tests of quantum measurements
- Abstract:
- We consider the problem of characterizing the set of input-output correlations that can be generated by an arbitrarily given quantum measurement. Our main result is to provide a closed-form, full characterization of such a set for any qubit measurement, and to discuss its geometrical interpretation. As applications, we further specify our results to the cases of real and complex symmetric, informationally complete measurements and mutually unbiased bases of a qubit, in the presence of isotropic noise. Our results provide the optimal device-independent tests of quantum measurements.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Preview, Version of record, pdf, 156.5KB, Terms of use)
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- Publisher copy:
- 10.1103/physrevlett.118.250501
Authors
- Publisher:
- American Physical Society
- Journal:
- Physical Review Letters More from this journal
- Volume:
- 118
- Article number:
- 250501
- Publication date:
- 2017-06-22
- Acceptance date:
- 2017-06-22
- DOI:
- EISSN:
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1079-7114
- ISSN:
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0031-9007
- Pmid:
-
28696747
- Language:
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English
- Keywords:
- Pubs id:
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pubs:704552
- UUID:
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uuid:bf0f440c-5829-4abb-a607-76ebf29d6e4d
- Local pid:
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pubs:704552
- Source identifiers:
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704552
- Deposit date:
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2019-10-21
- ARK identifier:
Terms of use
- Copyright date:
- 2017
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