Conference item
Mitotic phase based detection of chromosome segregation errors in embryonic stem cells
- Abstract:
- The detection of chromosome segregation errors in mitosis is an important area of biological research. Due to the rarity and subtle nature of such errors in untreated cell lines, there is a need for automated, high-throughput systems for quantifying the rates at which such defects occur. This paper presents a novel approach to detecting subtle chromosome segregation errors in mitosis in embryonic stem cells, targeting two cases: misaligned chromosomes in a metaphase cell, and lagging chromosomes between anaphase cells. Our method builds on existing approaches for analysis of other cell lines (e.g. HeLa) which label mitotic phases through mitosis and detect substantial deviations from normal mitotic progression. We apply these to more challenging, denser, stem cell lines. Leveraging the mitotic phase labelling allows us to detect smaller, more subtle defects within mitosis. This results in a very high recall rate, as necessary for detection of such rare events.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 1016.5KB, Terms of use)
-
- Publisher copy:
- 10.1109/isbi.2013.6556619
Authors
- Publisher:
- IEEE
- Host title:
- 2013 IEEE 10th International Symposium on Biomedical Imaging
- Pages:
- 892-895
- Publication date:
- 2013-07-15
- Event title:
- IEEE 10th International Symposium on Biomedical Imaging (ISBI 2013)
- Event location:
- San Francisco, California, USA
- Event website:
- https://www.aconf.org/conf_30637.2013_IEEE_10th_International_Symposium_on_Biomedical_Imaging_(ISBI_2013).html
- Event start date:
- 2013-04-07
- Event end date:
- 2013-04-11
- DOI:
- EISSN:
-
1945-8452
- ISSN:
-
1945-7928
- EISBN:
- 9781467364553
- ISBN:
- 9781467364560
- Language:
-
English
- Keywords:
- Pubs id:
-
446437
- Local pid:
-
pubs:446437
- Deposit date:
-
2024-07-17
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2013
- Rights statement:
- © Copyright 2013 IEEE - All rights reserved
- Notes:
- This is the accepted manuscript version of the article. The final version is available online from IEEE at https://dx.doi.org/10.1109/isbi.2013.6556619
If you are the owner of this record, you can report an update to it here: Report update to this record