Conference item
High energy white beam x-ray diffraction studies of residual strains in engineering components
- Abstract:
- In order to predict the durability of engineering components and improve performance, it is mandatory to understand residual stresses. The last decade has witnessed a significant increase of residual stress evaluation using diffraction of penetrating radiation, such as neutrons or high energy X-rays. They provide a powerful non-destructive method for determining the level of residual stresses in engineering components through precise characterisation of interplanar crystal lattice spacing. The unique non-destructive nature of these measurement techniques is particularly beneficial in the context of engineering design, since it allows the evaluation of a variety of structural and deformational parameters inside real components without material removal, or at worst with minimal interference. However, while most real engineering components have complex shape and are often large in size, leading to measurement and interpretation difficulties, since experimental facilities usually have limited space for mounting the sample, limited sample travel range, limited loading capacity of the sample positioning system, etc. Consequently, samples often have to be sectioned, requiring appropriate corrections on measured data; or facilities must be improved. Our research group has contributed to the development of engineering applications of high-energy X-ray diffraction methods for residual stress evaluation, both at synchrotron sources and in the lab setting, including multiple detector setup, large engineering component manipulation and measurement at the UK Synchrotron Radiation Source (SRS Daresbury), and in our lab at Oxford. A nickel base superalloy combustion casing and a large MIG welded A1 alloy plate were successfully studied.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Preview, Version of record, pdf, 2.0MB, Terms of use)
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- Publisher copy:
- 10.1063/1.2991349
- Publisher:
- American Institute of Physics
- Series:
- AIP Conference Proceedings
- Place of publication:
- http://proceedings.aip.org/proceedings/top.jsp
- Edition:
- Publisher's version
- DOI:
- Language:
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English
- Keywords:
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- UUID:
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uuid:bb648a20-2d06-4abe-a68c-429efa2b7ffa
- Local pid:
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ora:2858
- Deposit date:
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2009-07-06
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- Copyright holder:
- American Institute of Physics
- Copyright date:
- 2008
- Notes:
- Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following paper appeared as: Zhang, S. Y. et al. (2008). High energy white beam x-ray diffraction studies of residual strains in engineering components. In: Current Themes in Engineering Science 2007: Selected Presentations at the World Congress on Engineering, 2-4 July, 2007, London, UK, (AIP Conf. Proc. Vol. 1045), 41-50. New York: American Institute of Physics. It is available at http://link.aip.org/link/?APCPCS/1045/41/1
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