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On the robustness of semantic segmentation models to adversarial attacks

Abstract:
Deep Neural Networks (DNNs) have demonstrated exceptional performance on most recognition tasks such as image classification and segmentation. However, they have also been shown to be vulnerable to adversarial examples. This phenomenon has recently attracted a lot of attention but it has not been extensively studied on multiple, large-scale datasets and structured prediction tasks such as semantic segmentation which often require more specialised networks with additional components such as CRFs, dilated convolutions, skip-connections and multiscale processing. In this paper, we present what to our knowledge is the first rigorous evaluation of adversarial attacks on modern semantic segmentation models, using two large-scale datasets. We analyse the effect of different network architectures, model capacity and multiscale processing, and show that many observations made on the task of classification do not always transfer to this more complex task. Furthermore, we show how mean-field inference in deep structured models, multiscale processing (and more generally, input transformations) naturally implement recently proposed adversarial defenses. Our observations will aid future efforts in understanding and defending against adversarial examples. Moreover, in the shorter term, we show how to effectively benchmark robustness and show which segmentation models should currently be preferred in safety-critical applications due to their inherent robustness.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1109/tpami.2019.2919707

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Sub department:
Engineering Science
Role:
Author


Publisher:
Institute of Electrical and Electronics Engineers
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence More from this journal
Volume:
42
Issue:
12
Pages:
3040-3053
Publication date:
2019-05-29
Acceptance date:
2019-02-25
DOI:
EISSN:
1939-3539
ISSN:
0162-8828
Pmid:
31150338


Language:
English
Keywords:
Pubs id:
1146304
Local pid:
pubs:1146304
Deposit date:
2020-11-30

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