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Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes.

Abstract:

Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the objective lens. This article discusses results obtained using this method from structures formed by inorganic materials confined within the bores of carbon nanotubes. Such materials are shown to be at...

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Publisher copy:
10.1017/S1431927605050385

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
11
Issue:
5
Pages:
401-409
Publication date:
2005-10-01
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Source identifiers:
2732
Language:
English
Keywords:
Pubs id:
pubs:2732
UUID:
uuid:b6a3cf24-1f84-4d47-a113-eb61c45144b6
Local pid:
pubs:2732
Deposit date:
2013-02-20

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