Conference item
Stranski-Krastanov growth of InN nanostructures on GaN studied by RHEED, STM and AFM
- Abstract:
- The growth of self-assembled InN nanostructures on GaN by MBE has been studied using two different nitrogen sources. Stranski-Krastanov growth may be achieved but is highly sensitive to the V: III ratio as well as coverage and temperature. The size and shape of the resultant nanostructures depend on the nitrogen source used. Using thermally cracked ammonia, Stranski-Krastanov growth occurred only for thin layers (up to 8 monolayers) at high V: III ratios, as observed by RHEED and AIM. The sensitivity of the growth to the V: III ratio may be explained in terms of the interplay between equilibrium thermodynamics and growth kinetics. Similar experiments at higher V:III ratios were performed using a modified nitrogen plasma source. Stranski-Krastanov growth occurred and was observed in-situ by RHEED. The as-grown nanostructures were imaged in-vacuo by elevated-temperature STM, showing the dependence of island size and distribution on the InN coverage.
- Publication status:
- Published
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Authors
- Journal:
- PHYSICA STATUS SOLIDI A-APPLIED RESEARCH More from this journal
- Volume:
- 194
- Issue:
- 2
- Pages:
- 536-540
- Publication date:
- 2002-12-16
- Event title:
- International Workshop on Nitride Semiconductors
- DOI:
- EISSN:
-
1521-396X
- ISSN:
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0031-8965
- Keywords:
- Pubs id:
-
pubs:19290
- UUID:
-
uuid:b33c2c30-5f0c-4432-9740-0a4fcf404f7d
- Local pid:
-
pubs:19290
- Source identifiers:
-
19290
- Deposit date:
-
2012-12-19
Terms of use
- Copyright date:
- 2002
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