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Stranski-Krastanov growth of InN nanostructures on GaN studied by RHEED, STM and AFM

Abstract:
The growth of self-assembled InN nanostructures on GaN by MBE has been studied using two different nitrogen sources. Stranski-Krastanov growth may be achieved but is highly sensitive to the V: III ratio as well as coverage and temperature. The size and shape of the resultant nanostructures depend on the nitrogen source used. Using thermally cracked ammonia, Stranski-Krastanov growth occurred only for thin layers (up to 8 monolayers) at high V: III ratios, as observed by RHEED and AIM. The sensitivity of the growth to the V: III ratio may be explained in terms of the interplay between equilibrium thermodynamics and growth kinetics. Similar experiments at higher V:III ratios were performed using a modified nitrogen plasma source. Stranski-Krastanov growth occurred and was observed in-situ by RHEED. The as-grown nanostructures were imaged in-vacuo by elevated-temperature STM, showing the dependence of island size and distribution on the InN coverage.
Publication status:
Published

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Publisher copy:
10.1002/1521-396X(200212)194:2<536::AID-PSSA536>3.0.CO;2-B

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH More from this journal
Volume:
194
Issue:
2
Pages:
536-540
Publication date:
2002-12-16
Event title:
International Workshop on Nitride Semiconductors
DOI:
EISSN:
1521-396X
ISSN:
0031-8965


Keywords:
Pubs id:
pubs:19290
UUID:
uuid:b33c2c30-5f0c-4432-9740-0a4fcf404f7d
Local pid:
pubs:19290
Source identifiers:
19290
Deposit date:
2012-12-19

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