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Field-ion specimen preparation using focused ion-beam milling

Abstract:

Preparation of field-ion specimens from various materials has been accomplished using focused ion-beam milling in either a simple cutting mode or by application of an annular-shaped ion-milling pattern. These specimens have been investigated using field-ion microscopy and three-dimensional atom probe analysis. In the cutting mode, gallium implantation is minimised when using a lower beam energy. However, with annular milling, using 30 keV ions opposed to 10 keV ions results in less gallium im...

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Publication status:
Published

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Authors


Larson, DJ More by this author
Petford-Long, AK More by this author
Blamire, MG More by this author
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Volume:
79
Issue:
1-4
Pages:
287-293
Publication date:
1999-09-05
DOI:
ISSN:
0304-3991
URN:
uuid:b2105bfa-7826-49a7-9b00-a46b75fe9db5
Source identifiers:
26011
Local pid:
pubs:26011
Keywords:

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