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Modeling, calibration, and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors

Publication status:
Published

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Publisher copy:
10.1109/TIM.2002.807803

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Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
Journal:
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume:
51
Issue:
5
Pages:
996-1001
Publication date:
2002-10-05
DOI:
ISSN:
0018-9456
URN:
uuid:b1a95290-affa-4cc8-9bcc-de172c60a4bc
Source identifiers:
64498
Local pid:
pubs:64498

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