A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.

Journal article

A new method for the accurate determination of the symmetric coefficients of the wave aberration function has been developed. The relative defoci and displacements of images in a focus series are determined from an analysis of the phase correlation function between pairs of images, allowing the restoration of an image wave even when focus and specimen drift are present. Subsequently, the absolute coefficients of both defocus and 2-fold astigmatism are determined with a phase contrast index function. Overall this method allows a very accurate automated aberration determination even for largely crystalline samples with little amorphous contamination. Using experimental images of the complex oxide Nb16W18O94 we have demonstrated the new method and critically compared it with existing diffractogram based aberration determinations. A series of protocols for practical implementation is also given together with a detailed analysis of the accuracy achieved. Finally a focal series restoration of Nb16W18O94 with symmetric aberrations determined automatically using this method is presented.

Authors: Meyer, R; Kirkland, A; Saxton, W

• Journal: Ultramicroscopy
• Volume: 92
• Issue: 2
• Pages: 89-109
• Publication date: 2002-07-01
• DOI: 10.1016/s0304-3991(02)00071-2
• EISSN: 1879-2723
• ISSN: 0304-3991
• Language: English
• Keywords: Wave aberration function; High resolution electron microscopy; Image restoration