Journal article icon

Journal article

A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.

Abstract:

A new method for the accurate determination of the symmetric coefficients of the wave aberration function has been developed. The relative defoci and displacements of images in a focus series are determined from an analysis of the phase correlation function between pairs of images, allowing the restoration of an image wave even when focus and specimen drift are present. Subsequently, the absolute coefficients of both defocus and 2-fold astigmatism are determined with a phase contrast index fu...

Expand abstract

Actions


Access Document


Authors


Journal:
Ultramicroscopy
Volume:
92
Issue:
2
Pages:
89-109
Publication date:
2002-07-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:b0df2db7-42fa-4f04-8e2d-fe0f931d2abc
Source identifiers:
9783
Local pid:
pubs:9783

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP