Scattering-type near-field optical microscopy characterization of topological insulator Bi2Te3 nanowires

Conference item

Topological Insulator (TI) devices have potential applications in spintronic and low-loss communication devices. However, they are difficult to characterize with standard far-field spectroscopy due to contributions from both the surface and the bulk. Utilizing the surface-sensitive scattering type Scanning Nearfield Optical Microscopy (s-SNOM) technique coupled with high surface-to-volume ratio structures such as nanowires, the local dielectric function and electro-optical properties of the metallic surface states of TI candidate Bi 2 Te 3 are investigated. We demonstrate spectral resonant features at 1250 cm −1, which are imaged with nanoscale resolution.

Authors: Johnson, D; Vincent, T; Liu, X; Gholizadeh, B; Schoenherr, P

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: IEEE
• Host title: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
• Pages: 1-2
• Publication date: 2023-10-31
• Acceptance date: 2023-01-02
• Event title: 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2023)
• Event website: https://ieeexplore.ieee.org/xpl/conhome/10298848/proceeding
• Event start date: 2023-09-17
• Event end date: 2023-09-22
• DOI: 10.1109/irmmw-thz57677.2023.10299204
• EISSN: 2162-2035
• ISSN: 2162-2027
• EISBN: 9798350336603
• ISBN: 9798350336610
• Language: English