Journal article icon

Journal article

IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY

Publication status:
Published

Actions


Access Document


Authors


More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
ULTRAMICROSCOPY
Volume:
42
Pages:
1490-1497
Publication date:
1992-07-05
DOI:
ISSN:
0304-3991
URN:
uuid:aa0bdd64-89ee-4e99-aa24-6c9a65c5de47
Source identifiers:
8371
Local pid:
pubs:8371

Terms of use


Metrics


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP