Journal article

IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY

Publication status:: Published

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APA Style

Castell, M., Walls, M., & Howie, A. (1992). IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY. ULTRAMICROSCOPY, 42, 1490–1497.

MLA Style

Castell, M., et al. “IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY.” ULTRAMICROSCOPY, vol. 42, 1992, pp. 1490–97.

Chicago Style

Castell, M, M Walls, and A Howie. 1992. “IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY.” ULTRAMICROSCOPY 42: 1490–97.
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Publisher copy:: 10.1016/0304-3991(92)90471-U

Authors

+ Castell, M More by this author

Institution:: University of Oxford
Division:: MPLS
Department:: Materials
Role:: Author

+ Walls, M More by this author

Role:: Author

+ Howie, A More by this author

Role:: Author

Journal:: ULTRAMICROSCOPY More from this journal
Volume:: 42
Pages:: 1490-1497
Publication date:: 1992-07-01
DOI:: 10.1016/0304-3991(92)90471-U
ISSN:: 0304-3991

Pubs id:: pubs:8371
UUID:: uuid:aa0bdd64-89ee-4e99-aa24-6c9a65c5de47
Local pid:: pubs:8371
Source identifiers:: 8371
Deposit date:: 2012-12-19

Terms of use

Copyright date:: 1992

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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