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Journal article

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Publication status:
Published

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Publisher copy:
10.1017/S1431927609094069

Authors

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
MICROSCOPY AND MICROANALYSIS More from this journal
Volume:
15
Issue:
SUPPL. 2
Pages:
42-43
Publication date:
2009-07-01
DOI:
EISSN:
1435-8115
ISSN:
1431-9276


Language:
English
Pubs id:
pubs:254438
UUID:
uuid:a9cfdd96-0589-4d1e-a5f2-635fb5a8a497
Local pid:
pubs:254438
Source identifiers:
254438
Deposit date:
2012-12-19
ARK identifier:

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