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Journal article

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Publication status:
Published

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Publisher copy:
10.1017/S1431927609094069

Authors


Kirkland, AI More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
MICROSCOPY AND MICROANALYSIS
Volume:
15
Issue:
SUPPL. 2
Pages:
42-43
Publication date:
2009-07-05
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:a9cfdd96-0589-4d1e-a5f2-635fb5a8a497
Source identifiers:
254438
Local pid:
pubs:254438
Language:
English

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