Conference item
IMU-based online multi-lidar calibration
- Abstract:
- Modern autonomous systems typically use several sensors for perception. For best performance, accurate and reliable extrinsic calibration is necessary. In this research, we propose a reliable technique for the extrinsic calibration of several lidars on a vehicle without the need for odometry estimation or fiducial markers. First, our method generates an initial guess of the extrinsics by matching the raw signals of IMUs co-located with each lidar. This initial guess is then used in ICP and point cloud feature matching which refines and verifies this estimate. Furthermore, we can use observability criteria to choose a subset of the IMU measurements that have the highest mutual information - rather than comparing all the readings. We have successfully validated our methodology using data gathered from Scania test vehicles.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 3.8MB, Terms of use)
-
- Publisher copy:
- 10.1109/iv55156.2024.10588695
Authors
- Publisher:
- IEEE
- Host title:
- Proceedings of the 35th IEEE Intelligent Vehicles Symposium (IV 2024)
- Pages:
- 3227-3234
- Publication date:
- 2024-07-15
- Acceptance date:
- 2024-03-30
- Event title:
- 35th IEEE Intelligent Vehicles Symposium (IV 2024)
- Event location:
- Jeju Shinhwa World, Jeju Island, Korea
- Event website:
- https://ieee-iv.org/2024/
- Event start date:
- 2024-06-02
- Event end date:
- 2024-06-05
- DOI:
- EISSN:
-
2642-7214
- ISSN:
-
1931-0587
- Language:
-
English
- Keywords:
- Pubs id:
-
2017624
- Local pid:
-
pubs:2017624
- Deposit date:
-
2024-10-15
Terms of use
- Copyright holder:
- IEEE
- Copyright date:
- 2024
- Rights statement:
- © IEEE 2024
- Notes:
- This paper was presented at the 35th IEEE Intelligent Vehicles Symposium (IV 2024), 2nd-5th June 2024, Jeju Shinhwa World, Jeju Island, Korea. This is the accepted manuscript version of the article. The final version is available online from IEEE at: https://dx.doi.org/10.1109/iv55156.2024.10588695
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