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Measuring isoplanaticity in high-resolution electron microscopy

Abstract:

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetric aberrations (axial coma and three-fold astigmatism) by recording a combined tilt-focal series where at each beam tilt a short focal series of three images is recorded. In this paper we apply this...

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Publication status:
Published

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Journal:
ELECTRON MICROSCOPY AND ANALYSIS 2003
Volume:
179
Issue:
179
Pages:
199-202
Publication date:
2004-01-01
Event title:
Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003)
ISSN:
0951-3248
Source identifiers:
10813
ISBN:
0750309679
Pubs id:
pubs:10813
UUID:
uuid:a7d4c3ac-cf8d-4f7f-9b13-1a87c6d8c977
Local pid:
pubs:10813
Deposit date:
2012-12-19

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