The development and applications of STEM ptychography using direct electron detectors

Thesis

Since the introduction of direct electron detectors to scanning transmission electron microscopy (STEM), electron ptychography - a technique which utilises the interference in diffraction patterns to reconstruct the sample-induced phase changes of a transmitted electron wave - has significantly extended the capabilities of electron microscopy. However, a number of limitations to electron ptychography exist, namely the poor contrast transfer for low and high spatial frequencies to the phase...

Expand abstract

Authors: O'Leary, C

• Type of award: DPhil
• Level of award: Doctoral
• Awarding institution: University of Oxford
• Language: English
• Keywords: Electron Microscopy; Ptychography; Contrast transfer functions; STEM
• Subjects: Physics; Imaging; Crystallography; Condensed matter; Electron optics; Diffraction; Materials science