Journal article
Comparing the consistency of atom probe tomography measurements of small-scale segregation and clustering between the LEAP 3000 and LEAP 5000 instruments.
- Abstract:
- The local electrode atom probe (LEAP) has become the primary instrument used for atom probe tomography measurements. Recent advances in detector and laser design, together with updated hit detection algorithms, have been incorporated into the latest LEAP 5000 instrument, but the implications of these changes on measurements, particularly the size and chemistry of small clusters and elemental segregations, have not been explored. In this study, we compare data sets from a variety of materials with small-scale chemical heterogeneity using both a LEAP 3000 instrument with 37% detector efficiency and a 532-nm green laser and a new LEAP 5000 instrument with a manufacturer estimated increase to 52% detector efficiency, and a 355-nm ultraviolet laser. In general, it was found that the number of atoms within small clusters or surface segregation increased in the LEAP 5000, as would be expected by the reported increase in detector efficiency from the LEAP 3000 architecture, but subtle differences in chemistry were observed which are attributed to changes in the way multiple hit detection is calculated using the LEAP 5000.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
Actions
Access Document
- Files:
-
-
(Preview, Accepted manuscript, pdf, 1.3MB, Terms of use)
-
- Publisher copy:
- 10.1017/S1431927617000356
Authors
- Publisher:
- Cambridge University Press
- Journal:
- Microscopy and Microanalysis More from this journal
- Volume:
- 23
- Issue:
- 2
- Pages:
- 227-237
- Publication date:
- 2017-04-01
- Acceptance date:
- 2017-02-23
- DOI:
- EISSN:
-
1435-8115
- ISSN:
-
1431-9276
- Language:
-
English
- Keywords:
- Pubs id:
-
pubs:692334
- UUID:
-
uuid:9ed1c5af-60c1-43ee-ba84-5b4ece644d64
- Local pid:
-
pubs:692334
- Source identifiers:
-
692334
- Deposit date:
-
2017-05-25
Terms of use
- Copyright holder:
- Microscopy Society of America
- Copyright date:
- 2017
- Notes:
- © Microscopy Society of America 2017
If you are the owner of this record, you can report an update to it here: Report update to this record