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Journal article

Misfit dislocations generated from inhomogeneous sources and their critical thicknesses in a InGaAs/GaAs heterostructure grown by molecular beam epitaxy

Publication status:
Published

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Publisher copy:
10.1063/1.119112

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
APPLIED PHYSICS LETTERS More from this journal
Volume:
70
Issue:
23
Pages:
3134-3136
Publication date:
1997-06-09
DOI:
ISSN:
0003-6951


Pubs id:
pubs:25370
UUID:
uuid:96e280d9-1fa5-481e-84ac-08c9c81d7345
Local pid:
pubs:25370
Source identifiers:
25370
Deposit date:
2012-12-19

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