Journal article
Extending estimating hydrogen content in atom probe tomography experiments where H2 molecule formation occurs
- Abstract:
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We investigate a new method for estimating specimen hydrogen content in Atom Probe Tomography (APT) in experiments where molecular hydrogen ions (𝐻2 +) originating from the measurement environment can overlap with deuterium (𝐷 +) in the mass-to-charge-state spectrum, thus preventing direct application of isotopic marking for unambiguous hydrogen analysis. First, we apply an existing method for hydrogen content estimation, using 𝐻 +/ 𝐻2 + ratios obtained from paired deuterated/non-deuterated experiments, demonstrating sufficient residual uncertainty to motivate exploring an alternative method to accurately estimate hydrogen content. By varying the time between evaporation events, it is then shown that a highly correlated relationship between field evaporation rate and hydrogen content can also be used to predict hydrogen content. This leads to a new method for measuring hydrogen content within the specimen. We combine this extrapolation technique with continuous cycling of the evaporation rate or pulse frequency during an APT experiment. This could enable spatially resolved imaging of hydrogen concentrations despite the presence of a contaminant background hydrogen signal, without the need for deuteration.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Accepted manuscript, 3.4MB, Terms of use)
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- Publisher copy:
- 10.1017/S1431927621012332
Authors
- Publisher:
- Cambridge University Press
- Journal:
- Microscopy and Microanalysis More from this journal
- Volume:
- 28
- Issue:
- 4
- Pages:
- 1231-1244
- Publication date:
- 2021-07-28
- Acceptance date:
- 2021-07-01
- DOI:
- EISSN:
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1435-8115
- ISSN:
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1431-9276
- Language:
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English
- Keywords:
- Pubs id:
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1190056
- Local pid:
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pubs:1190056
- Deposit date:
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2021-09-07
Terms of use
- Copyright holder:
- Meier et al.
- Copyright date:
- 2021
- Rights statement:
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America.
- Notes:
-
This is the accepted manuscript version of the article. The final version is available from Cambridge University Press at https://doi.org/10.1017/S1431927621012332
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