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Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride.

Abstract:

We demonstrate that the aberration-corrected scanning transmission electron microscope has a sufficiently small depth of field to observe depth-dependent atomic displacements in a crystal. The depth-dependent displacements associated with the Eshelby twist of dislocations in GaN normal to the foil with a screw component of the Burgers vector are directly imaged. We show that these displacements are observed as a rotation of the lattice between images taken in a focal series. From the sense of...

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Publication status:
Published

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Authors


Lozano, JG More by this author
Guerrero-Lebrero, MP More by this author
D'Alfonso, AJ More by this author
Yasuhara, A More by this author
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Publisher:
American Physical Society
Journal:
Physical review letters
Volume:
113
Issue:
13
Pages:
135503
Publication date:
2014-09-05
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
URN:
uuid:965559b7-6d02-4b00-b296-b44ec35b8f5a
Source identifiers:
486169
Local pid:
pubs:486169
Language:
English

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