Journal article
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride.
- Abstract:
-
We demonstrate that the aberration-corrected scanning transmission electron microscope has a sufficiently small depth of field to observe depth-dependent atomic displacements in a crystal. The depth-dependent displacements associated with the Eshelby twist of dislocations in GaN normal to the foil with a screw component of the Burgers vector are directly imaged. We show that these displacements are observed as a rotation of the lattice between images taken in a focal series. From the sense of...
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- Publication status:
- Published
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Bibliographic Details
- Publisher:
- American Physical Society
- Journal:
- Physical Review Letters More from this journal
- Volume:
- 113
- Issue:
- 13
- Pages:
- 135503
- Publication date:
- 2014-09-01
- DOI:
- EISSN:
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1079-7114
- ISSN:
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0031-9007
Item Description
- Language:
-
English
- Pubs id:
-
pubs:486169
- UUID:
-
uuid:965559b7-6d02-4b00-b296-b44ec35b8f5a
- Local pid:
-
pubs:486169
- Source identifiers:
-
486169
- Deposit date:
-
2014-12-03
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- Copyright date:
- 2014
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