Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

Conference item

We report on ion emission from plasma produced on thick targets irradiated with nanosecond and femtosecond pulses delivered by mid-ultraviolet and soft x-ray lasers, respectively. To distinguish between different ion acceleration mechanisms, the maximum kinetic energy of ions produced under different interaction conditions is plotted versus laser fluence. The transformation of the time-of-flight detector signal into ion charge density distance-of-flight spectra makes it possible to determine ...

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Authors: Krása, J; Nassisi, V; Burian, T; Hájková, V; Chalupský, J

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: Society of Photo-optical Instrumentation Engineers
• Journal: Proceedings of SPIE
• Volume: 12578
• Article number: 125780J
• Publication date: 2023-06-06
• Acceptance date: 2023-01-18
• Event title: Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8)
• Event location: Prague, Czech Republic
• Event website: https://spie.org/EOO23/conferencedetails/xdam?SSO=1
• Event start date: 2023-04-24
• Event end date: 2023-04-28
• DOI: 10.1117/12.2670113
• EISSN: 1996-756X
• ISSN: 0277-786X
• Language: English
• Keywords: ablation; femtosecond pulses; ion detector function; ion scaling; soft-x-ray laser; free-electron laser; UV excimer laser; FFR; ion diagnostics; ion rarefaction; nanosecond pulses; ion acoustic velocity