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Journal article : Letter

Depth-resolved magnetization dynamics revealed by x-ray reflectometry ferromagnetic resonance

Abstract:
Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks have remained elusive. By probing the ferromagnetic resonance (FMR) modes with element-selective soft x-ray resonant reflectivity, we gain access to the magnetization dynamics as a function of depth. Most notably, using reflectometry ferromagnetic resonance (RFMR), we find a phase lag between the coupled ferromagnetic layers in [CoFeB/MgO/Ta]4 multilayers, which is invisible to other techniques. RFMR enables the time- and layer-resolved probing of the complex magnetization dynamics of a wide range of functional magnetic heterostructures with absorption edges in the soft x-ray wavelength regime.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1103/PhysRevLett.125.137201

Authors



Publisher:
American Physical Society
Journal:
Physical Review Letters More from this journal
Volume:
125
Article number:
137201
Publication date:
2020-09-24
Acceptance date:
2020-08-13
DOI:
EISSN:
1079-7114
ISSN:
0031-9007


Language:
English
Keywords:
Subtype:
Letter
Pubs id:
1126499
Local pid:
pubs:1126499
Deposit date:
2020-08-16

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