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Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample

Abstract:
Lattice defects play a key role in determining the properties of crystalline materials. Probing the three-dimensional (3D) lattice strains that govern their interactions remains a challenge. Bragg coherent diffraction imaging (BCDI) allows strain to be measured with nanoscale 3D resolution. However, it is currently limited to materials that form microcrystals. Here we introduce a technique that allows the manufacture of BCDI samples from bulk materials. Using tungsten as an example, we show that focused ion-beam machining can be used to extract, from macroscopic crystals, micron-sized BCDI samples containing specific preselected defects. To interpret the experimental data, we develop a displacement-gradient-based analysis for multireflection BCDI. This allows accurate recovery of the full lattice strain tensor from samples containing multiple dislocations. These capabilities open the door to BCDI as a microscopy tool for studying complex real-world materials.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1103/PhysRevMaterials.4.013801

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author


Publisher:
American Physical Society
Journal:
Physical Review Materials More from this journal
Volume:
4
Issue:
1
Article number:
013801
Publication date:
2020-01-14
Acceptance date:
2019-10-17
DOI:
EISSN:
2475-9953


Language:
English
Keywords:
Pubs id:
pubs:1063491
UUID:
uuid:9178a433-3650-4f09-8145-bcafb5e45d64
Local pid:
pubs:1063491
Source identifiers:
1063491
Deposit date:
2019-10-18

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