Depth sectioning using electron energy loss spectroscopy

Conference item

The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of focus, facilitating optical slicing or depth sectioning of samples. The inclusion of post specimen aberration corrected image forming lenses allows for scanning confocal electron microscopy with further improved depth resolution and selectivity. We show that in both scanning transmission electron microscopy and scanning confocal electron microscopy geometries, by performing a three dimensional raster scan through a specimen and detecting electrons scattered with a characteristic energy loss, it will be possible to determine the location of isolated impurities embedded within the bulk. © 2008 IOP Publishing Ltd.

Authors: D'Alfonso, A; Cosgriff, E; Findlay, S; Kirkland, A; Nellist, P

• Publication status: Published
• Host title: EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007
• Volume: 126
• Pages: 012037-012037
• Publication date: 2008-01-01
• DOI: 10.1088/1742-6596/126/1/012037
• EISSN: 1742-6596
• ISSN: 1742-6588