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Can direct electron detectors outperform phosphor-CCD systems for TEM?

Abstract:

A new generation of imaging detectors is being considered for application in TEM, but which device architectures can provide the best images? Monte Carlo simulations of the electron-sensor interaction are used here to calculate the expected modulation transfer of monolithic active pixel sensors (MAPS), hybrid active pixel sensors (HAPS) and double sided Silicon strip detectors (DSSD), showing that ideal and nearly ideal transfer can be obtained using DSSD and MAPS sensors. These results highl...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Volume:
126
Pages:
012089-012089
Host title:
EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007
Publication date:
2008-01-01
DOI:
EISSN:
1742-6596
ISSN:
1742-6588
Source identifiers:
17839
Pubs id:
pubs:17839
UUID:
uuid:8c3264d6-fc3a-46cd-a61c-ea3f9af56496
Local pid:
pubs:17839
Deposit date:
2012-12-19

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