Can direct electron detectors outperform phosphor-CCD systems for TEM?

Conference item

A new generation of imaging detectors is being considered for application in TEM, but which device architectures can provide the best images? Monte Carlo simulations of the electron-sensor interaction are used here to calculate the expected modulation transfer of monolithic active pixel sensors (MAPS), hybrid active pixel sensors (HAPS) and double sided Silicon strip detectors (DSSD), showing that ideal and nearly ideal transfer can be obtained using DSSD and MAPS sensors. These results highly recommend the replacement of current phosphor screen and charge coupled device imaging systems with such new directly exposed position sensitive electron detectors. © 2008 IOP Publishing Ltd.

Authors: Moldovan, G; Li, X; Kirkland, A

• Publication status: Published
• Host title: EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007
• Volume: 126
• Pages: 012089-012089
• Publication date: 2008-01-01
• DOI: 10.1088/1742-6596/126/1/012089
• EISSN: 1742-6596
• ISSN: 1742-6588