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Mapping strains at the nanoscale using electron back scatter diffraction

Abstract:

In this paper, we describe the use of electron back scatter diffraction (EBSD) to study strain variations in crystalline samples at the nanoscale. The analysis relies on cross correlation measurements of small shifts in the EBSD pattern measured at many points dispersed across the pattern. The method allows the full strain tensor, and lattice rotations to be obtained at a sensitivity of ∼10 -4. The method is applied to study variations of strains and rotations near the...

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Publication status:
Published

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Publisher copy:
10.1016/j.spmi.2008.10.046
Journal:
SUPERLATTICES AND MICROSTRUCTURES More from this journal
Volume:
45
Issue:
4-5
Pages:
285-294
Publication date:
2009-01-01
DOI:
EISSN:
1096-3677
ISSN:
0749-6036
Language:
English
Keywords:
Pubs id:
pubs:21430
UUID:
uuid:8b4f4c72-73d8-4402-9abb-1770286c9b27
Local pid:
pubs:21430
Source identifiers:
21430
Deposit date:
2012-12-19

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