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Hollow electron ptychographic diffractive imaging

Abstract:
We report a method for quantitative phase recovery and simultaneous electron energy loss spectroscopy analysis using ptychographic reconstruction of a data set of “hollow” diffraction patterns. This has the potential for recovering both structural and chemical information at atomic resolution with a new generation of detectors.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1103/physrevlett.121.146101

Authors


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Institution:
University of Oxford
Division:
MPLS Division
Department:
Materials
Role:
Author
ORCID:
0000-0002-6353-6000
Publisher:
American Physical Society
Journal:
Physical Review Letters More from this journal
Volume:
121
Issue:
14
Article number:
146101
Publication date:
2018-10-01
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
Pmid:
30339441
Language:
English
Pubs id:
pubs:928743
UUID:
uuid:8ae1b464-7ed0-476f-875a-6e2d28078695
Local pid:
pubs:928743
Source identifiers:
928743
Deposit date:
2019-03-20

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