Journal article
Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS
- Abstract:
- Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10⁻⁴. This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Preview, pdf, 652.9KB, Terms of use)
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- Publisher copy:
- 10.1107/S0909049502001905
Authors
- Publisher:
- International Union of Crystallography (IUCr)
- Journal:
- Journal of Synchrotron Radiation More from this journal
- Volume:
- 9
- Issue:
- 2
- Pages:
- 77-81
- Publication date:
- 2002-03-01
- Edition:
- Authorised author reprint
- DOI:
- ISSN:
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0909-0495
- Language:
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English
- Keywords:
- Subjects:
- UUID:
-
uuid:8a82ddb6-253a-4506-b7b5-959f329b43ac
- Local pid:
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ora:4588
- Deposit date:
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2010-12-09
Terms of use
- Copyright holder:
- International Union of Crystallography
- Copyright date:
- 2002
- Notes:
- Citation: Korsunsky, A. M. et al. (2002). 'Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS', Journal of Synchrotron Radiation 9 (2), 77-81. [Available at http://journals.iucr.org/s/].
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