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Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Abstract:

Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ~ 30 s per 0.3 mm³ sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10⁻⁴. This configuration is therefore highly...

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Publication status:
Published
Peer review status:
Peer reviewed

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
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Institution:
Daresbury Laboratory, Warrington, UK
Department:
Synchrotron Radiation Department
Role:
Author
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Institution:
Manchester Materials Science Centre, Manchester, UK
Role:
Author
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Institution:
ISIS Facility, Rutherford Appleton Laboratory, Chilton, Didcot, UK
Role:
Author
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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Publisher:
International Union of Crystallography (IUCr)
Journal:
Journal of Synchrotron Radiation More from this journal
Volume:
9
Issue:
2
Pages:
77-81
Publication date:
2002-03-01
DOI:
ISSN:
0909-0495
Language:
English
Keywords:
Subjects:
UUID:
uuid:8a82ddb6-253a-4506-b7b5-959f329b43ac
Local pid:
ora:4588
Deposit date:
2010-12-09

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