Journal article
An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature
- Abstract:
-
This paper presents an investigation into high temperature imaging of metals through the use of a novel heat stage for in situ Scanning Electron Microscopy (SEM). The results obtained demonstrate the benefits and challenges of SEM imaging at elevated temperatures of up to 850 °C using Secondary Electron (SE) and Electron Backscatter Diffraction (EBSD) detectors. The data collected using the heat stage demonstrate good beam, vacuum, and detector stability at high temperatures without the need ...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Authors
Bibliographic Details
- Publisher:
- AIP Publishing Publisher's website
- Journal:
- Review of Scientific Instruments Journal website
- Volume:
- 91
- Issue:
- 6
- Article number:
- 063702
- Publication date:
- 2020-06-04
- Acceptance date:
- 2020-05-15
- DOI:
- EISSN:
-
1089-7623
- ISSN:
-
0034-6748
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
1105444
- Local pid:
- pubs:1105444
- Deposit date:
- 2020-05-18
Terms of use
- Copyright holder:
- Heard, R et al.
- Copyright date:
- 2020
- Rights statement:
- © 2020 Author(s). Published under license by AIP Publishing.
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