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An investigation into experimental in situ scanning electron microscope (SEM) imaging at high temperature

Abstract:

This paper presents an investigation into high temperature imaging of metals through the use of a novel heat stage for in situ Scanning Electron Microscopy (SEM). The results obtained demonstrate the benefits and challenges of SEM imaging at elevated temperatures of up to 850 °C using Secondary Electron (SE) and Electron Backscatter Diffraction (EBSD) detectors. The data collected using the heat stage demonstrate good beam, vacuum, and detector stability at high temperatures without the need ...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/1.5144981

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Publisher:
AIP Publishing
Journal:
Review of Scientific Instruments More from this journal
Volume:
91
Issue:
6
Article number:
063702
Publication date:
2020-06-04
Acceptance date:
2020-05-15
DOI:
EISSN:
1089-7623
ISSN:
0034-6748
Language:
English
Keywords:
Pubs id:
1105444
Local pid:
pubs:1105444
Deposit date:
2020-05-18

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