Technical note 33: the reliability and validity of achievement tests in the second Young Lives school survey in Ethiopia

Record

This technical note gives details of the reliability and validity of the assessments used in the second school survey carried out by Young Lives in Ethiopia for the purpose of the construction of test scores on a common scale within each language for maths and reading comprehension. This document give details of the three-parameter model used to build the achievement scores in both content areas. We tested graphically for item fit and item bias (by gender and wave). Our results indicate that most of the items used have a good item fit as well as they did not show the presence of bias by wave or gender. Finally, we did an external validity analysis correlating the IRT scores (maths and reading comprehension) with individual and family characteristics, and the results showed that correlations were statistically significant with the expected signs.

Authors: León, J; Collahua, Y

• Publication status: Published
• Peer review status: Peer reviewed
• Publisher: Young Lives
• Host title: Technical note 33: the reliability and validity of achievement tests in the second Young Lives school survey in Ethiopia
• Place of publication: Oxford
• Publication date: 2015-09-01
• Keywords: school survey; Ethiopia; SBTMR