Journal article

Terahertz emission and lifetime measurements of ion-implanted semiconductors: Experiment and simulation

Abstract:: The spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials. © 2006 Optical Society of America.

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APA Style

Lloyd-Hughes, J., Castro-Camus, E., Fraser, M. D., Tan, H., Jagadish, C., & Johnston, M. (2006). Terahertz emission and lifetime measurements of ion-implanted semiconductors: Experiment and simulation. Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006.

MLA Style

Lloyd-Hughes, J., et al. “Terahertz Emission and Lifetime Measurements of Ion-Implanted Semiconductors: Experiment and Simulation.” Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006, 2006.

Chicago Style

Lloyd-Hughes, J, E Castro-Camus, MD Fraser, H Tan, C Jagadish, and M Johnston. 2006. “Terahertz Emission and Lifetime Measurements of Ion-Implanted Semiconductors: Experiment and Simulation.” Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006.
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Publisher copy:: 10.1109/CLEO.2006.4628606

Authors

+ Lloyd-Hughes, J More by this author

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+ Castro-Camus, E More by this author

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+ Fraser, MD More by this author

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+ Tan, H More by this author

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+ Jagadish, C More by this author

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Journal:: Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006 More from this journal
Publication date:: 2006-01-01
DOI:: 10.1109/CLEO.2006.4628606

Language:: English
Pubs id:: pubs:191327
UUID:: uuid:83b164eb-7e90-46f2-84d5-b86979da2434
Local pid:: pubs:191327
Source identifiers:: 191327
Deposit date:: 2012-12-19

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Copyright date:: 2006

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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