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EFFECT OF DIPPING RATE ON ALTERNATING LAYER LANGMUIR-BLODGETT-FILM STRUCTURE

Abstract:
X-ray and neutron reflectometry studies on deposited LB films have been performed. 'Rocking curves' have indicated accurate alignment of crystal planes parallel to the substrate. The effect of deposition speed has been investigated and found to lead to intermixing of alternating layer films at slower deposition speeds, having important implications for device fabrication.
Publication status:
Published

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Publisher copy:
10.1021/la00092a040

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Physical & Theoretical Chem
Role:
Author


Journal:
LANGMUIR More from this journal
Volume:
6
Issue:
2
Pages:
519-521
Publication date:
1990-02-01
DOI:
EISSN:
1520-5827
ISSN:
0743-7463


Language:
English
Pubs id:
pubs:121727
UUID:
uuid:8286fae7-c5e3-45d5-a485-242f576ef82b
Local pid:
pubs:121727
Source identifiers:
121727
Deposit date:
2012-12-19

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