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Two-terminal analog memory comprising self-assembled monolayers of edge-fused porphyrin oligomers

Abstract:
The study of molecular electronic devices displaying hysteresis, non-volatility, and analog switching in their current–voltage characteristics not only reveals fundamental information on electron transfer, but also provides interesting candidates for next-generation computing paradigms. In this work we report on the charge-transport properties of a family of self-assembled monolayer junctions formed from edge-fused porphyrin oligomers (monomer, dimer and trimer). We show that hysteresis emerges as molecular length increases, and that ON–OFF ratios between high and low conductance states reach over 200 for edge-fused porphyrin trimers. By applying voltage sweeps, the junction conductance can be modulated to a series of intermediate conductance states, between the high and low conductance states, that are stable over hour timescales at room temperature.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1039/d5nr02773j

Authors


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Institution:
University of Oxford
Division:
SSD
Department:
International Development
Sub department:
Refugee Studies Centre
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Chemistry Research Laboratory
Role:
Author
More by this author
Institution:
University of Oxford
Division:
SSD
Department:
International Development
Sub department:
Refugee Studies Centre
Role:
Author
ORCID:
0000-0003-1950-2097
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Chemistry Research Laboratory
Role:
Author
ORCID:
0000-0002-1801-8132
More by this author
Institution:
University of Oxford
Division:
SSD
Department:
International Development
Sub department:
Refugee Studies Centre
Role:
Author
ORCID:
0000-0003-1959-1675



Publisher:
Royal Society of Chemistry
Journal:
Nanoscale More from this journal
Publication date:
2025-09-10
Acceptance date:
2025-09-06
DOI:
EISSN:
2040-3372
ISSN:
2040-3364


Language:
English
Source identifiers:
3279152
Deposit date:
2025-09-12
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