Journal article icon

Journal article

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES

Abstract:
The morphology and microchemistry of interfaces in GaInAs/InP quantum well structures have been studied with extremely high resolution by the new technique of position sensitive atom probe microanalysis. This letter presents some preliminary results demonstrating the power of the technique in determining the structure and chemistry of individual interfaces in multilayer epitaxial semiconductor samples.
Publication status:
Published

Actions

Access Document

Publisher copy:
10.1063/1.101328

Authors

More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author


Journal:
APPLIED PHYSICS LETTERS More from this journal
Volume:
54
Issue:
16
Pages:
1555-1557
Publication date:
1989-04-17
DOI:
ISSN:
0003-6951


Language:
English
Pubs id:
pubs:1381
UUID:
uuid:7e59d037-d3a0-4f49-b55e-01ae6cbe29f9
Local pid:
pubs:1381
Source identifiers:
1381
Deposit date:
2012-12-19
ARK identifier:

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP