Journal article
Aberrations in 4Pi microscopy.
- Abstract:
- The combination of two opposing objective lenses in 4Pi fluorescence microscopy significantly improves the axial resolution and increases the collection efficiency. Combining 4Pi microscopy with other super-resolution techniques has resulted in the highest three-dimensional (3D) resolution in fluorescence microscopy to date. It has previously been shown that the performance of 4Pi microscopy is significantly affected by aberrations. However, a comprehensive description of 4Pi microscope aberrations has been missing. In this paper, we introduce an approach to describe aberrations in a 4Pi cavity through a new functional representation. We discuss the focusing properties of 4Pi systems affected by aberrations and discuss the implications for adaptive optics schemes for 4Pi microscopes based on this new insight.
- Publication status:
- Published
- Peer review status:
- Peer reviewed
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- Files:
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(Preview, Version of record, pdf, 2.9MB, Terms of use)
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- Publisher copy:
- 10.1364/oe.25.014049
Authors
- Publisher:
- Optical Society
- Journal:
- Optics Express More from this journal
- Volume:
- 25
- Issue:
- 13
- Pages:
- 14049-14058
- Publication date:
- 2017-06-01
- Acceptance date:
- 2017-05-24
- DOI:
- EISSN:
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1094-4087
- Pmid:
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28788990
- Language:
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English
- Keywords:
- Pubs id:
-
pubs:704660
- UUID:
-
uuid:79c652f7-f1a3-4807-82cd-93ad43affcd6
- Local pid:
-
pubs:704660
- Source identifiers:
-
704660
- Deposit date:
-
2017-08-17
- ARK identifier:
Terms of use
- Copyright holder:
- Optical Society of America
- Copyright date:
- 2017
- Notes:
- © 2017 Optical Society of America
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