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Journal article

Aberrations in 4Pi microscopy.

Abstract:
The combination of two opposing objective lenses in 4Pi fluorescence microscopy significantly improves the axial resolution and increases the collection efficiency. Combining 4Pi microscopy with other super-resolution techniques has resulted in the highest three-dimensional (3D) resolution in fluorescence microscopy to date. It has previously been shown that the performance of 4Pi microscopy is significantly affected by aberrations. However, a comprehensive description of 4Pi microscope aberrations has been missing. In this paper, we introduce an approach to describe aberrations in a 4Pi cavity through a new functional representation. We discuss the focusing properties of 4Pi systems affected by aberrations and discuss the implications for adaptive optics schemes for 4Pi microscopes based on this new insight.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1364/oe.25.014049

Authors

More by this author
Institution:
University of Oxford
Division:
MSD
Department:
Physiology Anatomy & Genetics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author


Publisher:
Optical Society
Journal:
Optics Express More from this journal
Volume:
25
Issue:
13
Pages:
14049-14058
Publication date:
2017-06-01
Acceptance date:
2017-05-24
DOI:
EISSN:
1094-4087
Pmid:
28788990


Language:
English
Keywords:
Pubs id:
pubs:704660
UUID:
uuid:79c652f7-f1a3-4807-82cd-93ad43affcd6
Local pid:
pubs:704660
Source identifiers:
704660
Deposit date:
2017-08-17
ARK identifier:

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