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Influence of the hole transporting layer on the thermal stability of inverted organic photovoltaics using accelerated-heat lifetime protocols

Abstract:

High power conversion efficiency (PCE) inverted organic photovoltaics (OPVs) usually use thermally evaporated MoO3 as a hole transporting layer (HTL). Despite the high PCE values reported, stability investigations are still limited and the exact degradation mechanisms of inverted OPVs using thermally evaporated MoO3 HTL remain unclear under different environmental stress factors. In this study, we monitor the accelerated lifetime performance under the ISOS-D-2 protocol (heat conditions 65 °C)...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1021/acsami.7b01183

Authors


Hermerschmidt, F More by this author
Georgiou, E More by this author
Tuladhar, SM More by this author
More by this author
ORCID:
0000-0001-8353-7345
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Publisher:
American Chemical Society Publisher's website
Journal:
ACS Applied Materials and Interfaces Journal website
Volume:
9
Issue:
16
Pages:
14136-14144
Publication date:
2017-03-30
Acceptance date:
2017-03-30
DOI:
EISSN:
1944-8252
ISSN:
1944-8244
Pubs id:
pubs:693468
URN:
uri:7338e931-2da2-44e8-879d-34fc0c268955
UUID:
uuid:7338e931-2da2-44e8-879d-34fc0c268955
Local pid:
pubs:693468

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